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X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids
Authors:
P. G. Heighway,
D. J. Peake,
T. Stevens,
J. S. Wark,
B. Albertazzi,
S. J. Ali,
L. Antonelli,
M. R. Armstrong,
C. Baehtz,
O. B. Ball,
S. Banerjee,
A. B. Belonoshko,
C. A. Bolme,
V. Bouffetier,
R. Briggs,
K. Buakor,
T. Butcher,
S. Di Dio Cafiso,
V. Cerantola,
J. Chantel,
A. Di Cicco,
A. L. Coleman,
J. Collier,
G. Collins,
A. J. Comley
, et al. (97 additional authors not shown)
Abstract:
We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren. We compare the predictions of our model with femtosecond x-ray diffraction patterns obtained from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density (HED) instrument of the European X-Ray F…
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We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren. We compare the predictions of our model with femtosecond x-ray diffraction patterns obtained from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density (HED) instrument of the European X-Ray Free-Electron Laser (EuXFEL), and find that the texture-aware TDS model yields more accurate results than does the conventional powder model owed to Warren. Nevertheless, we further show that: with sufficient angular detector coverage, the TDS signal is largely unchanged by sample orientation and in all cases strongly resembles the signal from a perfectly random powder; shot-to-shot fluctuations in the TDS signal resulting from grain-sampling statistics are at the percent level, in stark contrast to the fluctuations in the Bragg-peak intensities (which are over an order of magnitude greater); and TDS is largely unchanged even following texture evolution caused by compression-induced plastic deformation. We conclude that TDS is robust against texture variation, making it a flexible temperature diagnostic applicable just as well to off-the-shelf commercial foils as to ideal powders.
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Submitted 6 August, 2025;
originally announced August 2025.
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Femtosecond temperature measurements of laser-shocked copper deduced from the intensity of the x-ray thermal diffuse scattering
Authors:
J. S. Wark,
D. J. Peake,
T. Stevens,
P. G. Heighway,
Y. Ping,
P. Sterne,
B. Albertazzi,
S. J. Ali,
L. Antonelli,
M. R. Armstrong,
C. Baehtz,
O. B. Ball,
S. Banerjee,
A. B. Belonoshko,
C. A. Bolme,
V. Bouffetier,
R. Briggs,
K. Buakor,
T. Butcher,
S. Di Dio Cafiso,
V. Cerantola,
J. Chantel,
A. Di Cicco,
A. L. Coleman,
J. Collier
, et al. (100 additional authors not shown)
Abstract:
We present 50-fs, single-shot measurements of the x-ray thermal diffuse scattering (TDS) from copper foils that have been shocked via nanosecond laser-ablation up to pressures above 135~GPa. We hence deduce the x-ray Debye-Waller (DW) factor, providing a temperature measurement. The targets were laser-shocked with the DiPOLE 100-X laser at the High Energy Density (HED) endstation of the European X…
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We present 50-fs, single-shot measurements of the x-ray thermal diffuse scattering (TDS) from copper foils that have been shocked via nanosecond laser-ablation up to pressures above 135~GPa. We hence deduce the x-ray Debye-Waller (DW) factor, providing a temperature measurement. The targets were laser-shocked with the DiPOLE 100-X laser at the High Energy Density (HED) endstation of the European X-ray Free-Electron Laser (EuXFEL). Single x-ray pulses, with a photon energy of 18 keV, were scattered from the samples and recorded on Varex detectors. Despite the targets being highly textured (as evinced by large variations in the elastic scattering), and with such texture changing upon compression, the absolute intensity of the azimuthally averaged inelastic TDS between the Bragg peaks is largely insensitive to these changes, and, allowing for both Compton scattering and the low-level scattering from a sacrificial ablator layer, provides a reliable measurement of $T/Θ_D^2$, where $Θ_D$ is the Debye temperature. We compare our results with the predictions of the SESAME 3336 and LEOS 290 equations of state for copper, and find good agreement within experimental errors. We thus demonstrate that single-shot temperature measurements of dynamically compressed materials can be made via thermal diffuse scattering of XFEL radation.
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Submitted 6 January, 2025;
originally announced January 2025.
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Development of slurry targets for high repetition-rate XFEL experiments
Authors:
Raymond F. Smith,
Vinay Rastogi,
Amy E. Lazicki,
Martin G. Gorman,
Richard Briggs,
Amy L. Coleman,
Carol Davis,
Saransh Singh,
David McGonegle,
Samantha M. Clarke,
Travis Volz,
Trevor Hutchinson,
Christopher McGuire,
Dayne E. Fratanduono,
Damian C. Swift,
Eric Folsom,
Cynthia A. Bolme,
Arianna E. Gleason,
Federica Coppari,
Hae Ja Lee,
Bob Nagler,
Eric Cunningham,
Eduardo Granados,
Phil Heimann,
Richard G. Kraus
, et al. (4 additional authors not shown)
Abstract:
Combining an x-ray free electron laser (XFEL) with high power laser drivers enables the study of phase transitions, equation-of-state, grain growth, strength, and transformation pathways as a function of pressure to 100s GPa along different thermodynamic compression paths. Future high-repetition rate laser operation will enable data to be accumulated at >1 Hz which poses a number of experimental c…
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Combining an x-ray free electron laser (XFEL) with high power laser drivers enables the study of phase transitions, equation-of-state, grain growth, strength, and transformation pathways as a function of pressure to 100s GPa along different thermodynamic compression paths. Future high-repetition rate laser operation will enable data to be accumulated at >1 Hz which poses a number of experimental challenges including the need to rapidly replenish the target. Here, we present a combined shock-compression and X-ray diffraction study on vol% epoxy(50)-crystalline grains(50) (slurry) targets, which can be fashioned into extruded ribbons for high repetition-rate operation. For shock-loaded NaCl-slurry samples, we observe pressure, density and temperature states within the embedded NaCl grains consistent with observations for shock-compressed single-crystal NaCl.
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Submitted 11 January, 2022;
originally announced January 2022.
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Atomistic deformation mechanism of silicon under laser-driven shock compression
Authors:
S. Pandolfi,
S. Brennan Brown,
P. G. Stubley,
A. Higginbotham,
C. A. Bolme,
H. J. Lee,
B. Nagler,
E. Galtier,
R. Sandberg,
W. Yang,
W. L. Mao,
J. S. Wark,
A. Gleason
Abstract:
Silicon (Si) is one of the most abundant elements on Earth, and it is the most important and widely used semiconductor, constituting the basis of modern electronic devices. Despite extensive study, some properties of Si remain elusive. For example, the behaviour of Si under high pressure, in particular at the ultra-high strain rates characteristic of dynamic compression, has been a matter of debat…
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Silicon (Si) is one of the most abundant elements on Earth, and it is the most important and widely used semiconductor, constituting the basis of modern electronic devices. Despite extensive study, some properties of Si remain elusive. For example, the behaviour of Si under high pressure, in particular at the ultra-high strain rates characteristic of dynamic compression, has been a matter of debate for decades. A detailed understanding of how Si deforms is crucial for a variety of fields, ranging from planetary science to materials design. Simulations suggest that in Si the shear stress generated during shock compression is released inelastically, i.e., via a high-pressure phase transition, challenging the classical picture of relaxation via defect-mediated plasticity. However, experiments at the short timescales characteristic of shock compression are challenging, and direct evidence supporting either deformation mechanism remain elusive. Here, we use sub-picosecond, highly-monochromatic x-ray diffraction to study (100)-oriented single-crystal Si under laser-driven shock compression. We provide the first unambiguous, time-resolved picture of Si deformation at ultra-high strain rates, demonstrating the predicted inelastic shear release. Our results resolve the longstanding controversy on silicon deformation under dynamic compression, and provide direct proof of strain rate-dependent deformation mechanisms in a non-metallic system, which is key for the study of planetary-relevant materials.
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Submitted 15 November, 2021; v1 submitted 10 June, 2021;
originally announced June 2021.
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Pressure, temperature, and orientation dependent thermal conductivity of $α$-1,3,5-trinitro-1,3,5-triazinane ($α$-RDX)
Authors:
Romain Perriot,
Michael S. Powell,
John D. Lazarz,
C. A. Bolme,
Shawn D. McGrane,
David S. Moore,
M. J. Cawkwell,
Kyle J. Ramos
Abstract:
We use reverse non-equilibrium molecular dynamics (RNEMD) simulations to determine the thermal conductivity in $α$-RDX in the <100>, <010>, and <001> crystallographic directions. Simulations are carried out with the Smith-Bharadwaj non-reactive empirical interatomic potential [Smith & Bharadwaj, J. Phys. Chem. B 103, 3570(1999)], which represents the thermo-elastic properties of RDX with good accu…
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We use reverse non-equilibrium molecular dynamics (RNEMD) simulations to determine the thermal conductivity in $α$-RDX in the <100>, <010>, and <001> crystallographic directions. Simulations are carried out with the Smith-Bharadwaj non-reactive empirical interatomic potential [Smith & Bharadwaj, J. Phys. Chem. B 103, 3570(1999)], which represents the thermo-elastic properties of RDX with good accuracy. As an illustration, we report the temperature and pressure dependence of lattice constants of $α$-RDX, which compare well with experimental and ab initio results, as do linear and volume thermal expansion coefficients, which we also calculate. We find that the thermal conductivity depends linearly on the inverse temperature in the 200-400K regime due to the decrease in the phonon mean free path. The thermal conductivity also exhibits anisotropy, with a maximum difference at 300K of 24% between the <001> and <010> directions, an effect that remains when temperature increases. Thermal conductivity in the <100> direction is mostly between the two other directions, although crossovers are predicted with <001> at high temperature, and <010> at low temperature under pressure. We observe that the thermal conductivity varies linearly with pressure up to 4 GPa. The data are fitted to analytical functions for interpolation/extrapolation and use in continuum simulations. MD results are validated against experiments using impulsive stimulated thermal scattering (ISTS) on RDX single crystals at 293K and ambient pressure, showing good qualitative and quantitative agreement: same ordering between the three principal orientations, and an average error of 10% between the experiments and the model. These results provide confidence that the extracted analytical functions using the RNEMD methodology and the Smith-Bharadwaj potential can be applied to model the thermal conductivity of $α$-RDX.
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Submitted 22 March, 2021;
originally announced March 2021.