Using the Dark Count Rate of SPAD Implemented in CMOS FD-SOI Technology for True Random Number Generator.

Françis Calmon Rida Habach Wilfried Uhring Sara Pellegrini Dominique Golanski Jean-Gabriel Simiz Ugo Mureddu Using the Dark Count Rate of SPAD Implemented in CMOS FD-SOI Technology for True Random Number Generator. 485-489 2025 NewCAS https://doi.org/10.1109/NewCAS64648.2025.11107005 conf/newcas/2025 db/conf/newcas/newcas2025.html#CalmonHUPGSM25 streams/conf/newcas