<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/nems/TianYZLZJJ17" mdate="2026-07-01">
<author>Bian Tian</author>
<author>Qiuyue Yu</author>
<author>Zhongkai Zhang 0003</author>
<author>Qijing Lin</author>
<author>Na Zhao 0001</author>
<author>Weixuan Jing</author>
<author>Zhuangde Jiang</author>
<title>Measurement study of residual stress on tungsten-rhenium thin film thermocouples by nanoindentation technology.</title>
<pages>800-803</pages>
<year>2017</year>
<booktitle>NEMS</booktitle>
<ee>https://doi.org/10.1109/NEMS.2017.8017139</ee>
<crossref>conf/nems/2017</crossref>
<url>db/conf/nems/nems2017.html#TianYZLZJJ17</url>
</inproceedings>
</dblp>
