Uncertainty-Aware Gate-Lifetime Prediction of p-GaN Gate HEMTs Using Gaussian Processes.

Shuoyan Zhao Raj Thilak Rajan Andrea Natale Tallarico Maurizio Millesimo Vladislav Volosov Antonio Imbruglia Justin Dauwels Uncertainty-Aware Gate-Lifetime Prediction of p-GaN Gate HEMTs Using Gaussian Processes. 152-156 2025 ICSRS https://doi.org/10.1109/ICSRS68021.2025.11422186 conf/icsrs/2025 db/conf/icsrs/icsrs2025.html#ZhaoRTMVID25