Nicolò Zagni Francesco Maria Puglisi Paolo Pavan Muhammad Ashraful Alam Reliability of HfO<sub>2</sub>-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges. 158-184 2023 February 111 Proc. IEEE 2 https://doi.org/10.1109/JPROC.2023.3234607 db/journals/pieee/pieee111.html#ZagniPPA23