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"Dynamic Cross Characterization Network for Few-Shot IC Package Substrates ..."

Haoyuan Li, Ruiyun Yu, Bingyang Guo (2026)

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DOI: 10.1109/TII.2026.3683147

access: closed

type: Journal Article

metadata version: 2026-08-18

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Haoyuan Li, Ruiyun Yu, Bingyang Guo:
Dynamic Cross Characterization Network for Few-Shot IC Package Substrates Surface Defect Segmentation. IEEE Trans. Ind. Informatics 22(8): 7055-7065 (2026)

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last updated on 2026-08-18 11:29 CEST by the dblp team

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