X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids
Authors:
P. G. Heighway,
D. J. Peake,
T. Stevens,
J. S. Wark,
B. Albertazzi,
S. J. Ali,
L. Antonelli,
M. R. Armstrong,
C. Baehtz,
O. B. Ball,
S. Banerjee,
A. B. Belonoshko,
C. A. Bolme,
V. Bouffetier,
R. Briggs,
K. Buakor,
T. Butcher,
S. Di Dio Cafiso,
V. Cerantola,
J. Chantel,
A. Di Cicco,
A. L. Coleman,
J. Collier,
G. Collins,
A. J. Comley
, et al. (97 additional authors not shown)
Abstract:
We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren. We compare the predictions of our model with femtosecond x-ray diffraction patterns obtained from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density (HED) instrument of the European X-Ray F…
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We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren. We compare the predictions of our model with femtosecond x-ray diffraction patterns obtained from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density (HED) instrument of the European X-Ray Free-Electron Laser (EuXFEL), and find that the texture-aware TDS model yields more accurate results than does the conventional powder model owed to Warren. Nevertheless, we further show that: with sufficient angular detector coverage, the TDS signal is largely unchanged by sample orientation and in all cases strongly resembles the signal from a perfectly random powder; shot-to-shot fluctuations in the TDS signal resulting from grain-sampling statistics are at the percent level, in stark contrast to the fluctuations in the Bragg-peak intensities (which are over an order of magnitude greater); and TDS is largely unchanged even following texture evolution caused by compression-induced plastic deformation. We conclude that TDS is robust against texture variation, making it a flexible temperature diagnostic applicable just as well to off-the-shelf commercial foils as to ideal powders.
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Submitted 6 August, 2025;
originally announced August 2025.
Femtosecond temperature measurements of laser-shocked copper deduced from the intensity of the x-ray thermal diffuse scattering
Authors:
J. S. Wark,
D. J. Peake,
T. Stevens,
P. G. Heighway,
Y. Ping,
P. Sterne,
B. Albertazzi,
S. J. Ali,
L. Antonelli,
M. R. Armstrong,
C. Baehtz,
O. B. Ball,
S. Banerjee,
A. B. Belonoshko,
C. A. Bolme,
V. Bouffetier,
R. Briggs,
K. Buakor,
T. Butcher,
S. Di Dio Cafiso,
V. Cerantola,
J. Chantel,
A. Di Cicco,
A. L. Coleman,
J. Collier
, et al. (100 additional authors not shown)
Abstract:
We present 50-fs, single-shot measurements of the x-ray thermal diffuse scattering (TDS) from copper foils that have been shocked via nanosecond laser-ablation up to pressures above 135~GPa. We hence deduce the x-ray Debye-Waller (DW) factor, providing a temperature measurement. The targets were laser-shocked with the DiPOLE 100-X laser at the High Energy Density (HED) endstation of the European X…
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We present 50-fs, single-shot measurements of the x-ray thermal diffuse scattering (TDS) from copper foils that have been shocked via nanosecond laser-ablation up to pressures above 135~GPa. We hence deduce the x-ray Debye-Waller (DW) factor, providing a temperature measurement. The targets were laser-shocked with the DiPOLE 100-X laser at the High Energy Density (HED) endstation of the European X-ray Free-Electron Laser (EuXFEL). Single x-ray pulses, with a photon energy of 18 keV, were scattered from the samples and recorded on Varex detectors. Despite the targets being highly textured (as evinced by large variations in the elastic scattering), and with such texture changing upon compression, the absolute intensity of the azimuthally averaged inelastic TDS between the Bragg peaks is largely insensitive to these changes, and, allowing for both Compton scattering and the low-level scattering from a sacrificial ablator layer, provides a reliable measurement of $T/Θ_D^2$, where $Θ_D$ is the Debye temperature. We compare our results with the predictions of the SESAME 3336 and LEOS 290 equations of state for copper, and find good agreement within experimental errors. We thus demonstrate that single-shot temperature measurements of dynamically compressed materials can be made via thermal diffuse scattering of XFEL radation.
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Submitted 6 January, 2025;
originally announced January 2025.