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BibTeX records: Yang Liu 0103
@article{DBLP:journals/mr/ZhangLWFFSZ18,
author = {Hao Zhang and
Yang Liu and
Lingen Wang and
Jiajie Fan and
Xuejun Fan and
Fenglian Sun and
Guoqi Zhang},
title = {A new hermetic sealing method for ceramic package using nanosilver
sintering technology},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {143--149},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.030},
doi = {10.1016/J.MICROREL.2017.12.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangLWFFSZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuSZXYZ15,
author = {Yang Liu and
Fenglian Sun and
Hao Zhang and
Tong Xin and
Cadmus A. Yuan and
Guoqi Zhang},
title = {Interfacial reaction and failure mode analysis of the solder joints
for flip-chip {LED} on {ENIG} and Cu-OSP surface finishes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1234--1240},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.005},
doi = {10.1016/J.MICROREL.2015.05.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuSZXYZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLWS15,
author = {H. W. Zhang and
Yang Liu and
J. Wang and
F. L. Sun},
title = {Effect of elevated temperature on {PCB} responses and solder interconnect
reliability under vibration loading},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2391--2395},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.033},
doi = {10.1016/J.MICROREL.2015.07.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangLWS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuLZWYZSL14,
author = {Yang Liu and
Stanley Y. Y. Leung and
Jia Zhao and
Cell K. Y. Wong and
Cadmus A. Yuan and
Guoqi Zhang and
Fenglian Sun and
Liangliang Luo},
title = {Thermal and mechanical effects of voids within flip chip soldering
in {LED} packages},
journal = {Microelectron. Reliab.},
volume = {54},
number = {9-10},
pages = {2028--2033},
year = {2014},
url = {https://doi.org/10.1016/j.microrel.2014.07.034},
doi = {10.1016/J.MICROREL.2014.07.034},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuLZWYZSL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuSZWZ14,
author = {Yang Liu and
Fenglian Sun and
Hongwu Zhang and
J. Wang and
Zhen Zhou},
title = {Evaluating board level solder interconnects reliability using vibration
test methods},
journal = {Microelectron. Reliab.},
volume = {54},
number = {9-10},
pages = {2053--2057},
year = {2014},
url = {https://doi.org/10.1016/j.microrel.2014.07.058},
doi = {10.1016/J.MICROREL.2014.07.058},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuSZWZ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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